Terahertz Technology for Non-Destructive Testing Applications: A Comparative Study of Continuous Wave (CW) and Time-Domain Spectroscopy (TDS) Systems
Published 17-09-2024
Keywords
- Terahertz Technology,
- Continuous Wave System,
- Time Domain System,
- Non-Destructive Testing Applications
How to Cite
Copyright (c) 2024 Journal of Non-Destructive Testing and Evaluation (JNDE)
This work is licensed under a Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.
Abstract
This paper provides an overview of Terahertz (THz) technology in Non-Destructive Testing (NDT) applications. Beginning with a brief discussion on the basics and current market trends of NDT techniques, this paper highlights the distinct properties of THz technology, including its non-ionizing, non-invasive nature and its ability to penetrate non-conductive materials. Depending on the specific application, different systems cover the THz frequency range from 0.1 to 3.5 THz and can provide volume inspection and high-resolution thickness determination. THz technology offers better detection capabilities for lightweight materials such as composites and helps in rapid and precision measurement, catering to industries with stringent quality and safety requirements. The paper also discusses in detail about various Terahertz systems such as Continuous Wave (CW) and Time-Domain Spectroscopy (TDS) systems developed by TeraLumen Solutions. It also emphasizes the uses, advantages and disadvantages of each of these systems in various applications so that informed decisions can be made regarding the selection of the most suitable device or technique for their specific application needs.
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