Vol. 21 No. 2 (2024): Journal of Non Destructive Testing and Evaluation (JNDE), June 2024
Research Papers

Terahertz Technology for Non-Destructive Testing Applications: A Comparative Study of Continuous Wave (CW) and Time-Domain Spectroscopy (TDS) Systems

Published 17-09-2024

Keywords

  • Terahertz Technology,
  • Continuous Wave System,
  • Time Domain System,
  • Non-Destructive Testing Applications

How to Cite

Jyotirmayee Dash, Lenin B, Desh Praveen Kumar, Ruban Raj, Srinidhie Bragadesh, Shyamsunder Mandayam, & Bala Pesala. (2024). Terahertz Technology for Non-Destructive Testing Applications: A Comparative Study of Continuous Wave (CW) and Time-Domain Spectroscopy (TDS) Systems. Journal of Non-Destructive Testing and Evaluation (JNDE), 21(2), 49–55. Retrieved from https://jnde.isnt.in/index.php/JNDE/article/view/86

Abstract

This paper  provides an overview of Terahertz (THz) technology in Non-Destructive Testing (NDT) applications. Beginning with a brief discussion on the basics and current market trends of NDT techniques, this paper highlights the distinct properties of THz technology, including its non-ionizing, non-invasive nature and its ability to penetrate non-conductive materials.  Depending on the specific application, different systems cover the THz frequency range from 0.1 to 3.5 THz and can provide volume inspection and high-resolution thickness determination. THz technology offers better detection capabilities for lightweight materials such as composites and helps in rapid and precision measurement, catering to industries with stringent quality and safety requirements. The paper also discusses in detail about various Terahertz systems such as Continuous Wave (CW) and Time-Domain Spectroscopy (TDS) systems developed by TeraLumen Solutions. It also emphasizes the uses, advantages and disadvantages of each of these systems in various applications so that informed decisions can be made regarding the selection of the most suitable device or technique for their specific application needs.

References

  1. D. Nüßler and J. Jonuscheit, “Terahertz based non-destructive testing (NDT),” tm - Technisches Messen, vol. 88, no. 4, pp. 199–210, Apr. 2021, doi: 10.1515/teme-2019-0100.
  2. S. K. Dwivedi, M. Vishwakarma, and A. Soni, “Advances and Researches on Non Destructive Testing: A Review,” 2018. [Online]. Available: www.sciencedirect.comwww.materialstoday.com/proceedings
  3. https://www.mordorintelligence.com/industry-reports/terahertz-technologies-market.”
  4. F. Ospald et al., “Aeronautics composite material inspection with a terahertz time-domain spectroscopy system.” [Online]. Available: https://www.spiedigitallibrary.org/terms-of-use
  5. F. Ellrich et al., “Terahertz Quality Inspection for Automotive and Aviation Industries,” J Infrared Millim Terahertz Waves, vol. 41, no. 4, pp. 470–489, Apr. 2020, doi: 10.1007/s10762-019-00639-4.
  6. Y. H. Tao, A. J. Fitzgerald, and V. P. Wallace, “Non-contact, non-destructive testing in various industrial sectors with terahertz technology,” Sensors (Switzerland), vol. 20, no. 3. MDPI AG, Feb. 01, 2020. doi: 10.3390/s20030712.
  7. N. Karpowicz, H. Zhong, J. Xu, K. I. Lin, J. S. Hwang, and X. C. Zhang, “Comparison between pulsed terahertz time-domain imaging and continuous wave terahertz imaging,” Semicond Sci Technol, vol. 20, no. 7, Jul. 2005, doi: 10.1088/0268-1242/20/7/021.
  8. F. Hindle, A. Cuisset, R. Bocquet, and G. Mouret, “Continuous-wave terahertz by photomixing: applications to gas phase pollutant detection and quantification,” Comptes Rendus Physique, vol. 9, no. 2. pp. 262–275, Mar. 2008. doi: 10.1016/j.crhy.2007.07.009.
  9. Z. Zhang, Y. Lu, C. Lv, Q. Mao, S. Wang, and S. Yan, “Restoration of integrated circuit terahertz image based on wavelet denoising technique and the point spread function model,” Opt Lasers Eng, vol. 138, p. 106413, Mar. 2021, doi: 10.1016/j.optlaseng.2020.106413.
  10. S. Unnikrishnakurup, J. Dash, S. Ray, B. Pesala, and K. Balasubramaniam, “Nondestructive evaluation of thermal barrier coating thickness degradation using pulsed IR thermography and THz-TDS measurements: A comparative study,” NDT & E International, vol. 116, p. 102367, Dec. 2020, doi: 10.1016/j.ndteint.2020.102367.